The whole Field of View (FOV) or specific Regions of Interest (ROI) within the FOV can be used to select one or more features for measurement (e.g. hole diameters, edge positions). Software control of the illumination allows the user to optimise the image for each measurement.
Typical CMM-Ve applications:
- Small features which are difficult to probe with tactile styli
- Soft or easily deformed components
- Printed or deposited patterns
- Printed circuit boards
One of the advantages of the CMM-Ve system is that you can use multiple sensors to inspect your components. The CMM-Ve is compatible with several auto probe changers, allowing you to swap between the CMM-Ve and other point-to-point and scanning sensors.
- Auto change between the CMM-Ve and other traditional CMM sensors
- All CMM-Ve cameras are available in versions compatible with the TESASTAR-m and the Renishaw PH10.
- CMM-Ve systems have integral software-controlled illumination.
- All CMM-Ve cameras can be used with the TESASTAR-r or Renishaw ACR-3 auto change racks.
- CMM-Ve provides vision measurement capabilities for large components.